About this scholarly article

2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Characteristic Tracer for Measurement of Family of I-V Characteristics of Bipolar Transistors by Ch, Kim D.; Semenov, Alexanrler S.; Tatarinov, Pavel S. is a scholarly article available to read on EtoBox.

Author

Ch, Kim D.; Semenov, Alexanrler S.; Tatarinov, Pavel S.

Publisher

IEEE

Published

2018

Language

EN