Opening book details…
About this Engineering article
Reliability and value engineering : M. M. Tall, Proc. 3rd Ann. New York Conf. Electron. Reliab., pp. 4-2–4-8, sponsored by I.R.E. (Oct. 1963) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1964
- Field
- Engineering (Physical Sciences)