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Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs by Kim, Daeyeon (author);Chandra, Vikas (author);Aitken, Robert (author);Blaauw, David (author);Sylvester, Dennis (author) is a scholarly article available to read on EtoBox.
- Author
- Kim, Daeyeon (author);Chandra, Vikas (author);Aitken, Robert (author);Blaauw, David (author);Sylvester, Dennis (author)
- Published
- 2011