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About this Engineering article
Reliability study on polycrystalline silicon thin film resistors used in LSIs under thermal and electrical stress : Hiroko Akimori, Nobuo Owada, Tadayuki Taneoka and Hizura UDA. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 276 (March 1990) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1991
- Language
- EN
- Field
- Engineering (Physical Sciences)