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About this Physics and Astronomy article
Quantitative Materials Analysis of Micro Devices Using Absorption-based Thickness Measurements by Sim, L M; Wog, B S; Spowage, A C is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Sim, L M; Wog, B S; Spowage, A C
- Publisher
- Institute of Physics; IOP Publishing (ISSN 1742-6588)
- Published
- 2006
- Field
- Physics and Astronomy (Physical Sciences)