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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 28 January 2017)] High-Speed Biomedical Imaging and Spectroscopy: Toward Big Data Instrumentation and Management II - Imaging heterogeneity using an x-ray free-electron laser (Conference Presentation) by Tsia, Kevin K.; Goda, Keisuke; van der Schot, Gijs; Ekeberg, Tomas; Hajdu, Janos is a scholarly article available to read on EtoBox.

Author
Tsia, Kevin K.; Goda, Keisuke; van der Schot, Gijs; Ekeberg, Tomas; Hajdu, Janos
Publisher
SPIE
Published
2017
Language
EN