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About this Engineering article
Microstructure, hardness, resistivity and thermal stability of sputtered oxide films of AlCoCrCu0.5NiFe high-entropy alloy by Yuan-Sheng Huang; Ling Chen; Hong-Wei Lui; Ming-Hong Cai; Jien-Wei Yeh is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yuan-Sheng Huang; Ling Chen; Hong-Wei Lui; Ming-Hong Cai; Jien-Wei Yeh
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0921-5093)
- Published
- 2007
- Field
- Engineering (Physical Sciences)
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