About this scholarly article

2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - A study of failure mechanisms in CMOS & BJT ICs and their effect on device reliability by Rajesh, M.G.; Vinod, Gopika; Das, D.; Bhatnagar, P.V.; Pithawa, C.K. is a scholarly article available to read on EtoBox.

Author

Rajesh, M.G.; Vinod, Gopika; Das, D.; Bhatnagar, P.V.; Pithawa, C.K.

Publisher

IEEE

Published

2010

Language

EN