Opening book details…
About this Engineering article
Single event burnout of power MOSFETs caused by nuclear reactions with heavy ions by Kuboyama, S.; Matsuda, S.; Kanno, T.; Hirose, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kuboyama, S.; Matsuda, S.; Kanno, T.; Hirose, T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1994
- Field
- Engineering (Physical Sciences)
More by Kuboyama, S.; Matsuda, S.; Kanno, T.; Hirose, T.
Browse all works by Kuboyama, S.; Matsuda, S.; Kanno, T.; Hirose, T.