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Reliability, Robustness and Failure Mechanisms of LED Devices by Deshayes, Yannick, Bechou, Laurent is a scholarly article available to read on EtoBox.

What is Reliability, Robustness and Failure Mechanisms of LED Devices about?

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a comple

Author

Deshayes, Yannick, Bechou, Laurent

Publisher

ISTE Press Ltd. ; Elsevier Ltd

Published

2016

Language

EN

ISBN

9780081010884