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About this Materials Science article
Applications of Atomic Force Microscopy to Structural Characterization of Organic Thin Films by J.A. Zasadzinski; R. Viswanathan; D.K. Schwartz; J. Garnaes; L. Madsen; S. Chiruvolu; J.T. Woodward; M.L. Longo is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- J.A. Zasadzinski; R. Viswanathan; D.K. Schwartz; J. Garnaes; L. Madsen; S. Chiruvolu; J.T. Woodward; M.L. Longo
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-7757)
- Published
- 1994
- Language
- EN
- Field
- Materials Science (Physical Sciences)