About this Engineering article
Thickness and roughness dependence of DC modulation noise in thin film magnetic recording disk media by Katti, R.R.; Saunders, D.A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Katti, R.R.; Saunders, D.A.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)