About this scholarly article

2014 IEEE International Reliability Physics Symposium - Write disturb analyses on half-selected cells of cross-point RRAM arrays by Li, Haitong; Chen, Hong-Yu; Chen, Zhe; Chen, Bing; Liu, Rui; Qiu, Gang; Huang, Peng; Zhang, Feifei; Zizhen Jiang, ; Gao, Bin; Liu, Lifeng; Liu, Xiaoyan; Yu, Shimeng; Wong, H.-S. Philip; Kang, Jinfeng is a scholarly article available to read on EtoBox.

Author

Li, Haitong; Chen, Hong-Yu; Chen, Zhe; Chen, Bing; Liu, Rui; Qiu, Gang; Huang, Peng; Zhang, Feifei; Zizhen Jiang, ; Gao, Bin; Liu, Lifeng; Liu, Xiaoyan; Yu, Shimeng; Wong, H.-S. Philip; Kang, Jinfeng

Publisher

IEEE

Published

2014

Language

EN