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About this Engineering article
Characterization of threading dislocations in GaN (0001) substrates by photoluminescence imaging, cathodoluminescence mapping and etch pits by Yao, Yongzhao; Ishikawa, Yukari; Sudo, Masaki; Sugawara, Yoshihiro; Yokoe, Daisaku is a Engineering article available to read on EtoBox.
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- Author
- Yao, Yongzhao; Ishikawa, Yukari; Sudo, Masaki; Sugawara, Yoshihiro; Yokoe, Daisaku
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)