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About this Engineering article
Comparison of Synthetic Test Circuits for Ultra-high-voltage Circuit Breakers by Sheng, B.L.; van der Sluis, L. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sheng, B.L.; van der Sluis, L.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; ScienceOpen; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-8977)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)