About this scholarly article

SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Lasers and Optics for Surface Analysis - Laser ablation/ionization analysis of trace impurities from bulk materials by Alimpiev, Sergey S.; Belov, M. E.; Nikiforov, Sergey M.; de Vries, Mattanjah S. is a scholarly article available to read on EtoBox.

Author

Alimpiev, Sergey S.; Belov, M. E.; Nikiforov, Sergey M.; de Vries, Mattanjah S.

Publisher

SPIE

Published

1993

Language

EN