Skip to content

Opening book details…

About this Engineering article

Interface States in the Silicon/silicon-oxide System Observed by Thermally Stimulated Charge Release by Saunders, A.F.; Wright, G.T. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Saunders, A.F.; Wright, G.T.
Publisher
The Institution of Electrical Engineers; Institution of Electrical Engineers; Institute of Electrical Engineers; Institution of Engineering and Technology (IET) (ISSN 0013-5194)
Published
1970
Field
Engineering (Physical Sciences)

More by Saunders, A.F.; Wright, G.T.

Browse all works by Saunders, A.F.; Wright, G.T.