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About this Engineering article
Displacement Damage Effects Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Submicron Technology by Virmontois, Cedric; Goiffon, Vincent; Magnan, Pierre; Girard, Sylvain; Inguimbert, Christophe; Petit, Sophie; Rolland, Guy; Saint-Pe, Olivier is a Engineering article available to read on EtoBox.
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- Author
- Virmontois, Cedric; Goiffon, Vincent; Magnan, Pierre; Girard, Sylvain; Inguimbert, Christophe; Petit, Sophie; Rolland, Guy; Saint-Pe, Olivier
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2010
- Field
- Engineering (Physical Sciences)