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About this Engineering article
Determination of dielectric constant and loss of high-K thin films in the microwave frequencies by K. Sudheendran; D. Pamu; M. Ghanashyam Krishna; K.C. James Raju is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- K. Sudheendran; D. Pamu; M. Ghanashyam Krishna; K.C. James Raju
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0263-2241)
- Published
- 2010
- Language
- EN
- Field
- Engineering (Physical Sciences)
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