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Elimination of peak overlap in EDS digital X-ray maps by M. Moulaert; O. van Der Biest; J. Pinxter is a Materials Science article available to read on EtoBox.

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Two important factors limiting the usefulness of X-ray maps are background X-ray radiation and peak overlap. In both cases one may get the erroneous impression that an element is present in a particular area, whereas in fact it is not. These problems are aggravated by the use of an energy dispersive X-ray spectrometer (EDS) because of its relatively low resolution and peaklbackground ratio. The problems can be overcome by the technique of digital beam control. Instead of continuously scanning the beam with simultaneous recording of X-ray pulses, the beam is moved in discrete steps, the X-ray intensity of interest is measured and the resulting counts stored in computer memory, for subsequent display on a CRT screen. Hardware and software for this operation are available for most commercial EDS systems. Most of the packages provide adequate means to deal with the background problem, e.g. by definition of a threshold X-ray intensity below which points will not be displayed or by actually subtracting a measured background at each point (pixel). The present note describes a simple procedure by which the peak overlap problem can also be adequately dealt with, in line with the qualitative

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Author

M. Moulaert; O. van Der Biest; J. Pinxter

Publisher

Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0741-0581)

Published

1987

Language

EN

Field

Materials Science (Physical Sciences)