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About this Engineering article
A correlation study of substrate and epitaxial wafer with 4H-N type silicon carbide by Zhao, Lixia; Wu, Huiwang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhao, Lixia; Wu, Huiwang
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 2019
- Language
- EN
- Field
- Engineering (Physical Sciences)