About this scholarly article

2002 IEEE International Conference on Industrial Technology, 2002. IEEE ICIT '02. - 3D profile measurement by color pattern projection and system calibration by Sinlapeecheewa, C.; Takamasu, K. is a scholarly article available to read on EtoBox.

Author

Sinlapeecheewa, C.; Takamasu, K.

Publisher

IEEE

Published

2002