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About this Engineering article
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality by Hjelen, Jarle; Qvale, A.H.; Gomo, Ø. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hjelen, Jarle; Qvale, A.H.; Gomo, Ø.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 1994
- Field
- Engineering (Physical Sciences)