About this document
CISA Workflow for SEM and XPS Analysis by prathompoom.newyawong is a document available to read on EtoBox.
The document outlines the Thermo Scientific Correlative Imaging and Surface Analysis (CISA) Workflow, which integrates scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) to enhance the understanding of material surfaces. It emphasizes the importance of combining high-resolution imaging with chemical composition analysis to achieve comprehensive insights into materials used in various applications, including batteries and nanomaterials. The document also discusses the use of Thermo
- Author
- prathompoom.newyawong
- Language
- EN