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About this Engineering article
Simultaneous determination of defect distributions and energies near InGaN/GaN quantum wells by capacitance–voltage measurement by Kim, Tae-Soo; Lim, Seung-Young; Jung, Gunwoo; Moon, Youngboo; Hong, Soon-Ku; Song, Jung-Hoon is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Tae-Soo; Lim, Seung-Young; Jung, Gunwoo; Moon, Youngboo; Hong, Soon-Ku; Song, Jung-Hoon
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0022-3727)
- Published
- 2017
- Field
- Engineering (Physical Sciences)