About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Optics, Instruments, and Missions - Simulation methods for thick polycapillaries and x-ray lenses by 3D ray tracing by Berlu, Jean-Marc; Chevallier, Pierre; Hoover, Richard B.; Walker II, Arthur B. C. is a scholarly article available to read on EtoBox.

Author

Berlu, Jean-Marc; Chevallier, Pierre; Hoover, Richard B.; Walker II, Arthur B. C.

Publisher

SPIE

Published

1998

Language

EN