About this Engineering article
Perimeter governed minority carrier lifetimes in 4H-SiC p+n diodes measured by reverse recovery switching transient analysis by Philip G. Neudeck is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Philip G. Neudeck
- Publisher
- Kessinger Publishing, LLC
- Published
- 1998
- Language
- EN
- ISBN
- 9781166499808
- Field
- Engineering (Physical Sciences)