About this document
Modeling Multiple Stuck-at Faults by Aria Sudarman is a document available to read on EtoBox.
This document presents a technique for modeling multiple stuck-at faults in combinational and sequential circuits as equivalent single stuck-at faults. The technique allows existing single fault simulation and test generation tools to be used to analyze multiple faults. It works by inserting additional modeling gates at specific lines depending on the type and location of faults. The modeling ensures the original and modeled circuits are functionally equivalent and the targeted multiple fault behaves equiva
- Author
- Aria Sudarman
- Language
- EN