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What is Compact Silicon Photonic Interferometer about?

This document presents a novel compact silicon photonic Michelson Interferometer (T-CMMI) that demonstrates improved tolerance to manufacturing variability. The study employs a theoretical calibration method and a virtual wafer-based Monte Carlo approach to evaluate design variability, achieving a peak wavelength standard deviation of only 0.32 nm, significantly better than traditional designs. Additionally, the T-CMMI design reduces the footprint to 35 μm × 135 μm, saving substantial wafer area compared to

Author

MURSAL AYUB

Language

EN