Opening book details…
Can I read Ultra-fast Material Metrology on EtoBox?
Ultra-fast Material Metrology by Horn, Alexander, PD Dr is a book available to read on EtoBox.
What is Ultra-fast Material Metrology about?
<p><p>this Book Is The First To Describe Novel Measurement Techniques Of Processes During Laser-matter Interaction Using Ultra-fast Lasers. Targeted At Both Engineers And Physicists, Initial Chapters Address The Working Tools, The History Of Laser Ultra-fast Metrology, An Overview Of Ultra-fast Laser Sources, And The Fundamentals Of Laser Radiation-matter Interaction. Ultra-fast Laser Radiation Is Discussed In Chapter 4, While Further Chapters Describe The Methodology Of Pump And Probe In Practice, As Well As Applications For Pump And Probe Metrology In Engineering, Including Spectroscopy And Imaging Techniques. Chapter 7 Describes In Perspectives For The New Field Of Research And Predicts The Metrology Of The Future, Showing New Potential Applications Of Laser Sources And New Detectors In Combination With Improved Pump And Probe Methods. <p>from The Contents:<p><ul><li>introduction<p><li>ultra-fast Engineering Working Tools<p><li>fundamentals Of Laser Interaction<p><li>fundamentals Of Pump And Probe<p><li>examples For Ultra-fast Detection Methods<p><li>applications Of Pump And Probe Metrology<p><li>perspectives For The Future<p><li>summary</ul></p>
- Author
- Horn, Alexander, PD Dr
- Publisher
- Wiley-VCH-Verl
- Published
- 2009
- Language
- EN
- ISBN
- 9783527408870
- Subjects
- Engineering, Stem
More by Horn, Alexander, PD Dr
Browse all works by Horn, Alexander, PD Dr
Similar books
- Ultra-fast ASP.NET : Building Ultra-fast and Ultra-scalable Web Sites Using ASP.NET and SQL Server — Richard Kiessig (auth.) (2010)
- Optical Metrology — Kjell J. Gåsvik (2002)
- The Physics of Laser Radiation–Matter Interaction : Fundamentals, and Selected Applications in Metrology — Alexander Horn (2022)
- Transverse Disciplines in Metrology : Proceedings of the 13th International Metrology Congress, 2007 - Lille, France — French College of Metrology; International Metrology Congress (2009)
- Ultra-fast All-optical Signal Processing Devices — Dr. Hiroshi Ishikawa (2008)
- Optical Metrology for Precision Engineering — Yuki Shimizu Wei Gao (2021)