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Frequency domain analysis of 3ω-scanning thermal microscope probe—Application to tip/surface thermal interface measurements in vacuum environment by Pernot, G. (author);Metjari, A. (author);Chaynes, H. (author);Weber, M. (author);Isaiev, M. (author);Lacroix, D. (author) is a Physics and Astronomy article available to read on EtoBox.

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Author
Pernot, G. (author);Metjari, A. (author);Chaynes, H. (author);Weber, M. (author);Isaiev, M. (author);Lacroix, D. (author)
Publisher
AIP Publishing
Published
2021
Field
Physics and Astronomy (Physical Sciences)

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