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About this scholarly article
2001 Siberian Russian Student Workshop on Electron Devices and Materials. Proceedings 2nd Annual (IEEE Cat. No.01EX469) - Examination of thin porous layers and heteroepitaxial structures containing an underlayer of porous silicon by Leonov, I.A.; Pchelyakov, O.P.; Mogilnikov, K.P. is a scholarly article available to read on EtoBox.
- Author
- Leonov, I.A.; Pchelyakov, O.P.; Mogilnikov, K.P.
- Publisher
- Novosibirsk State Tech. Univ
- Published
- 2001
- Language
- EN
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