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About this Materials Science article
Comparison of rapid ramp voltage and tunnelling injection stress experiments for the characterization of thin MOS gate oxides by O. Brière; P. Cottin; A. Straboni is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- O. Brière; P. Cottin; A. Straboni
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-3093)
- Published
- 1995
- Language
- EN
- Field
- Materials Science (Physical Sciences)