About this scholarly article

2006 International Telecommunications Symposium - Fault tolerance in IEEE 802.11 WLANs by de Deus, Flavio E.; Puttini, Ricardo S.; Molinaro, Luis F.; Abdalla, Humberto; Amvame-Nze, G.; Kabara, Joseph is a scholarly article available to read on EtoBox.

Author

de Deus, Flavio E.; Puttini, Ricardo S.; Molinaro, Luis F.; Abdalla, Humberto; Amvame-Nze, G.; Kabara, Joseph

Publisher

IEEE

Published

2006