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About this Engineering article
Effects of shock-induced defect density on flux pinning in melt-textured YBa2Cu3O7−δ by M. J. Kramer; R. W. Mc Callum; W. J. Nellis; U. Balachandran is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. J. Kramer; R. W. Mc Callum; W. J. Nellis; U. Balachandran
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)
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