About this scholarly article

72nd Device Research Conference - Operating principle verification and scaling benefits of SGLC eNVM by Park, Sung-Kun; Kim, Nam-Yoon; Kown, Eun-Mee; Kim, Sang-Yong; Cho, In-Wook; Yoo, Kyung-Dong is a scholarly article available to read on EtoBox.

Author

Park, Sung-Kun; Kim, Nam-Yoon; Kown, Eun-Mee; Kim, Sang-Yong; Cho, In-Wook; Yoo, Kyung-Dong

Publisher

IEEE

Published

2014

Language

EN