About this scholarly article

Digest of Papers IEEE International Workshop on IDDQ Testing - Reliability, test, and I/sub DDQ/ measurements by Hawkins, C.F.; Keshavarzi, A.; Soden, J.M. is a scholarly article available to read on EtoBox.

Author

Hawkins, C.F.; Keshavarzi, A.; Soden, J.M.

Publisher

IEEE Comput. Soc

Published

1997

Language

EN