Skip to content

Opening book details…

About this scholarly article

2015 16th International Conference on Electronic Packaging Technology (ICEPT) - Study on the failure behavior of BGA solder interconnections under fatigue loading by Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng is a scholarly article available to read on EtoBox.

Author
Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng
Publisher
IEEE
Published
2015

More by Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng

Browse all works by Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng