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About this scholarly article
2015 16th International Conference on Electronic Packaging Technology (ICEPT) - Study on the failure behavior of BGA solder interconnections under fatigue loading by Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng is a scholarly article available to read on EtoBox.
- Author
- Xu, Xing; Chen, Gaiqing; Cheng, Mingsheng
- Publisher
- IEEE
- Published
- 2015
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