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About this Materials Science article
Raman investigation of submicro-grained Si films obtained by incoherent UV photo-CVD of silicon hydrides by B. Prevot; C. Fuchs; R. Henck; E. Fogarassy is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- B. Prevot; C. Fuchs; R. Henck; E. Fogarassy
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 1432-0630)
- Published
- 1998
- Field
- Materials Science (Physical Sciences)
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