About this scholarly article

Proceedings of the 54th Annual Design Automation Conference 2017 on - DAC '17 - Correlated Rare Failure Analysis via Asymptotic Probability Evaluation by Tao, Jun; Yu, Handi; Zhou, Dian; Su, Yangfeng; Zeng, Xuan; Li, Xin is a scholarly article available to read on EtoBox.

Author

Tao, Jun; Yu, Handi; Zhou, Dian; Su, Yangfeng; Zeng, Xuan; Li, Xin

Publisher

ACM Press

Published

2017

Language

EN