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About this Engineering article
Verhulst Model Analyses Of Technological Growth In Optoelectronics by Saito, Fujio is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Saito, Fujio
- Publisher
- The International Society for Optical Engineering; SPIE - International Society for Optical Engineering; S P I E - International Society for Optical Engineering; SPIE-Intl Soc Optical Eng (ISSN 0091-3286)
- Published
- 1984
- Language
- EN
- Field
- Engineering (Physical Sciences)