About this scholarly article

1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record - Self annealing effect on neutron irradiated silicon detectors by Hall effect analysis by Biggeri, U.; Borchi, E.; Bruzzi, M.; Lazanu, S.; Li, Z. is a scholarly article available to read on EtoBox.

Author

Biggeri, U.; Borchi, E.; Bruzzi, M.; Lazanu, S.; Li, Z.

Publisher

IEEE

Published

1995