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About this Engineering article
SRAM Interleaving Distance Selection With a Soft Error Failure Model by Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2009
- Field
- Engineering (Physical Sciences)