About this scholarly article

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Max-Fill: A method to generate high quality delay tests by Fan, X.; Reddy, S.M.; Pomeranz, I. is a scholarly article available to read on EtoBox.

Author

Fan, X.; Reddy, S.M.; Pomeranz, I.

Publisher

IEEE

Published

2011