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What is CLSM for Rapid Graphene Characterization about?
1) Confocal laser scanning microscopy (CLSM) is demonstrated to be a superior tool for rapidly characterizing large-area 2D materials like graphene with high spatial resolution. 2) CLSM provides intensity and topography images of exfoliated graphene on SiO2 that correlate well with atomic force microscopy and Raman spectroscopy measurements for determining graphene layer thickness. 3) CLSM is also applied to chemical vapor deposition graphene on SiO2 and epitaxial graphene on silicon carbide, showing it
- Author
- Faris Fadli
- Language
- EN