About this scholarly article

2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Comparing prediction methods for LED failure measured with Transient Thermal Analysis by Zippelius, Andreas; Hans, Alexander; Liu, E; Schmid, Maximilian; Perez-Velazquez, Judith; Elger, Gordon is a scholarly article available to read on EtoBox.

Author

Zippelius, Andreas; Hans, Alexander; Liu, E; Schmid, Maximilian; Perez-Velazquez, Judith; Elger, Gordon

Publisher

IEEE

Published

2020