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About this Engineering article
Quantitative Investigation of Surface Charge Distribution and Point Probing Characteristics of Spherical Scattering Electrical Field Probe for Precision Measurement of Miniature Internal Structures with High Aspect Ratios by Bian, Xingyuan; Cui, Junning; Lu, Yesheng; Zhao, Yamin; Cheng, Zhongyi; Tan, Jiubin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Bian, Xingyuan; Cui, Junning; Lu, Yesheng; Zhao, Yamin; Cheng, Zhongyi; Tan, Jiubin
- Publisher
- MDPI AG; Multidisciplinary Digital Publishing Institute (MDPI); Basel: MDPI AG, 2011- (ISSN 2076-3417)
- Published
- 2020
- Field
- Engineering (Physical Sciences)