About this scholarly article

Proceedings of 1994 IEEE International Electron Devices Meeting - Interface trap induced thermionic and field emission current in off-state MOSFET's by Tahui Wang, ; Tse-En Chang, ; Chimoon Huang, is a scholarly article available to read on EtoBox.

Author

Tahui Wang, ; Tse-En Chang, ; Chimoon Huang,

Publisher

IEEE

Published

1994

Language

EN