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About this Chemistry article
A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry by Czyzycki, Mateusz; Kokkoris, Mike; Karydas, Andreas-Germanos is a Chemistry article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Chemistry.
- Author
- Czyzycki, Mateusz; Kokkoris, Mike; Karydas, Andreas-Germanos
- Publisher
- Royal Society of Chemistry; The Royal Society of Chemistry; Royal Society of Chemistry (RSC) (ISSN 0267-9477)
- Published
- 2020
- Field
- Chemistry (Physical Sciences)
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