About this scholarly article

The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers - Chicago, IL, USA (21-23 June 1989)] [1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers - Advanced automatic test pattern generation techniques for path delay faults by Schulz, M.H.; Fuchs, K.; Fink, F. is a scholarly article available to read on EtoBox.

Author

Schulz, M.H.; Fuchs, K.; Fink, F.

Publisher

IEEE Comput. Soc. Press

Published

1989